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Atomic Force Microscopes: Tosca Anton Paar France

Atomic Force Microscopes: Tosca

Microscopes

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“ Patented, intelligent features covering each step in the AFM measurement procedure create a unique, highly streamlined AFM workflow enabling 10 times faster results than with conventional AFM systems. Instead of spending days learning to operate the AFM, start measuring after 1 hour. Fast and safe cantilever loading in seconds, automatic laser alignment, the most intuitive sample navigation, and the safest engagement procedure on the market lead you to your goal: more time to focus on your research results. ”
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Top-level AFM for entry-level budgets: with the fastest measurement setup and largest sample stage, the Tosca series will keep up with your AFM nano surface analysis.
 
Tosca is the first choice for researchers, pioneers, thinkers, and creators in nanotechnology material science.
 
Mode switching with head exchange was yesterday: Tosca enables measurement on the exact same spot using all available modes combined in one head.


Top-level AFM for entry-level budgets
Biggest sample stage in price segment (50 mm fully addressable)
Fastest time-to-measure on the market (only 3 min)
Scan size of 15 µm in Z and 90 µm x 90 µm in X and Y direction
Cantilever exchange in less than 10 seconds
All modes on the same sample spot without head exchange

Fastest measurement Largest sample holder Nanoscale surface analysis
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