3-D Profilometers

3-D Profilometers for Surface Characterization. High-precision 3-D profilometer technology that works on rough, smooth and stepped surfaces without contact.

These products are based on scanning white-light interferometry, also called coherent or vertical scanning interferometry or coherence radar. With their large vertical range and nanometer resolution, they are ideal tools for determining flatness, height differences and parallelism of large surfaces and structures, including soft materials.

TMS 500 TopMap

System with high precision and without contact, designed for rapid and efficient characterization of surfaces of components of mechanical precision

TMS-100 TopMap Metro.Lab

Designed for measuring large-area topography on most surfaces and has an excellent price/performance ratio.

TMS-300 TopMap In.Line

The ideal metrology system for precisely characterizing and controlling surface quality in a production environment.

TMS-1200 TopMap µ.Lab

A precise optical microscope that features a very high lateral resolution that enables measurements on microstructures such as MEMS