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EtherCAT system for length measurement in harsh environement - MSX-EC3701-8 ADDI-DATA FRANCE SAS

EtherCAT system for length measurement in harsh environement - MSX-EC3701-8

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“ The MSX-EC-3701-8 system allows the precise acquisition of LVDT or half-bridge transducers despite of numerous interferences in the industrial field ”
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The new EtherCAT system by ADDI-DATA for length measurement MSX-EC-3701-8 has 8 single-ended channels for the acquisition of 8 half-bridge or LVDT transducers with 24-bit resolution. The MSX-EC-3701-8 complies with the degree of protection IP 65, it is designed for an operating temperature from -40 °C to +85 °C and is equipped with numerous protective circuits for reliable use in the industrial environment.
The transducers are directly connected through 5-pin M18 connectors. The Auto-refresh mode always displays the most current values. The acquisition can be started through the 24 V trigger or synchro input. To start the measurement, the rising edge, the falling edge or both edges generated by the external trigger signal can be selected. With the counter, you can define the number of edges after which acquisition should be started. A version with 16 channels for the acquisition of 16 half-bridge or LVDT transducers is being planned. To acquire more than 16 transducers, the system can be daisy-chained with further systems and be synchronised in the µs range. This allows you to start the data acquisition, to generate trigger events and to synchronise the time simultaneously on several EtherCAT systems.
As EtherCAT is real-time capable and offers a wide range of topologies (line, tree, ring, star and their combinations), the system is suited for numerous different applications, such as thickness measurement, profile and surface measurement, statistic process control, etc.

Acquisition of up to 8 transducers For LVDT and half bridge sensors 24-bit resolution Degree of protection IP 65 Operating temperature -40 °C to +85 °C 24 V digital trigger input Daisy chaining Synchronisation of several systems in the µs range

Gear wheel control Acquisition of sensor data Quality control Automatic parts control Surface testing

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