White light interferometer for reliable thickness measurement | interferoMETER 5200-TH

The new IMS5200-TH white light interferometer opens up new possibilities for fast and reliable thickness measurements. The controller features intelligent evaluation and enables precise thickness measurement of transparent layers as thin as 1 µm. Their high measuring rate up to 24 kHz makes the IMS5200 models ideal for industrial use. Nanometer accuracy for layers as thin as 1 µm.

Ideal for industrial environments

The robust sensor and the controller in a metal housing make the system ideally suitable for integration into production lines. With its compact design and large operating range, the sensor is easy to integrate. It provides stable measurement results even in vibrating environments. The controller can be installed in the control cabinet on a DIN rail. Cable lengths up to 10 m allow a spatial separation of sensor and controller. Commissioning and parameterization are conveniently performed via web interface and do not require any software installation.