White light interferometer for reliable thickness measurement with submicron accuracy

“ High-precision thickness measurements of the thinnest layers Materials as thin as 1 µm Sub-nanometer resolution ”

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Presentation

The new IMS5200-TH white light interferometer opens up new possibilities for fast and reliable thickness measurements. The controller features intelligent evaluation and enables precise thickness measurement of transparent layers as thin as 1 µm. Their high measuring rate up to 24 kHz makes the IMS5200 models ideal for industrial use. Nanometer accuracy for layers as thin as 1 µm.

Technical features

Measuring rate up to 24 kHz for fast, stable measurements Easy integration due to large operating range Precise coating thickness measurement: 1 µm to 100 µm Multi-peak: multi-layer measurement up to 5 layers possible Industry-optimized sensor with robust metal housing Can be used in a vacuum Simple configuration via web interface

Usage scope

For industrial use

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